Controlling Film Thickness Distribution by Magnetron Sputtering with Rotation and Revolution

نویسندگان

چکیده

The laterally graded multilayer collimator is a vital part of high-precision diffractometer. It applied as condensing reflectors to convert divergent X-rays from laboratory X-ray sources into parallel beam. thickness the film varies with angle incidence guarantee every position on mirror satisfies Bragg reflection. In principle, accuracy parameters sputtering conditions essential for achieving reliable result. this paper, we proposed precise method fabrication based planetary motion magnetron system control. This uses fast and slow particle model obtain transport process, then combines it establish distribution model. Moreover, in are derived experimental inversion improve accuracy. revolution rotation substrate holder during final deposition process achieved by speed curve calculated according Measurement results reflection test (XRR) show that error film, coated parabolic cylinder Si substrate, less than 1%, demonstrating effectiveness optimized obtaining accurate distribution.

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ژورنال

عنوان ژورنال: Coatings

سال: 2021

ISSN: ['2079-6412']

DOI: https://doi.org/10.3390/coatings11050599